Printed circuit board test assisting apparatus and printed circuit board test assisting method

Printed circuit board test assisting apparatus and printed circuit board test assisting method

  • CN 101,963,651 A
  • Filed: 07/21/2010
  • Published: 02/02/2011
  • Est. Priority Date: 07/22/2009
  • Status: Active Grant
First Claim
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1. printed circuit board test utility appliance, its auxiliary test that is formed on the wiring pattern on the printed circuit board (PCB), described printed circuit board test utility appliance comprises:

  • First database, this first database is stored described attribute information and described positional information so that indicate the attribute of described wiring pattern and attribute information and the positional information and the mode that described wiring pattern is associated of position;

    Second database, this second database storing positional information and dimension information, this positional information and dimension information indicate position and the size that the pattern that is present in the solid pattern that is located in the described printed circuit board (PCB) removes the zone;

    The 3rd database, the 3rd database storing degradation information, this degradation information indicate the degradation that removes characteristics of signals size that position relation between the zone and described pattern remove the zone, in the described wiring pattern with respect to described wiring pattern and described pattern;

    The importation, this importation is transfused to the attribute information of wiring pattern;

    The degradation processing section, this degradation processing section obtains and is input to the degradation of the characteristics of signals in the corresponding described wiring pattern of attribute information of described importation based on removing positional information and the dimension information and the described degradation information in zone with the positional information of the corresponding described wiring pattern of attribute information that is input to described importation, described pattern;

    AndExtract the processing section, this extractions processing section is extracted the wiring pattern that degradation is equal to or greater than predetermined extent and is tested to be used for actual measurement from the wiring pattern that degradation has been obtained by described degradation processing section.

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