Cis circuit test probe card

Cis circuit test probe card

  • CN 102,043,072 A
  • Filed: 12/02/2009
  • Published: 05/04/2011
  • Est. Priority Date: 10/14/2009
  • Status: Active Application
First Claim
Patent Images

1. CIS circuit test probe is characterized in that it comprises:

  • One substrate, this substrate have at least one hole and at least one probe, and each this probe is arranged near corresponding this hole;

    AndOne optical module, this optical module is arranged at the adjacent domain of this substrate, and this optical module to this substrate, collimates this light in a ray cast.

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