Examining system, examining method, CT (computed tomography) device and detecting device

Examining system, examining method, CT (computed tomography) device and detecting device

  • CN 102,175,699 B
  • Filed: 10/30/2007
  • Issued: 10/22/2014
  • Est. Priority Date: 10/30/2007
  • Status: Active Grant
First Claim
Patent Images

1. check a system for prohibited items, this system comprises:

  • CT device, this CT device comprises;

    slip ring, the radiographic source connecting with slip ring, relative with radiographic source and be connected to the sniffer on slip ring;

    AndTransmit the conveyer of inspected object, inspected object marches to while approaching slip ring place plane, and be decelerated to that low speed is advanced and after radiographic source stops divergent-ray, accelerate at a high speed and advance,Wherein said sniffer comprises N row detector, and has preset space length between the described detector of adjacent two row, and wherein N is greater than 1 integer, andIn the inspection area of the every rotating 360 degrees of slip ring, every row'"'"'s detector checks the fan-shaped part of the 360 degree/N in this region, the every rotating 360 degrees/N of slip ring simultaneously, and the distance that conveyer moves object is the centre distance of adjacent two row'"'"'s detectors,Described system also comprises the scanned imagery device for obtaining two dimensional image, described CT device and describedly can simultaneously move for the scanned imagery device that obtains two dimensional image, to obtain the 3-D view of inspected object and to obtain two dimensional image by described for the scanned imagery device that obtains two dimensional image by CT device simultaneouslyWherein said CT device and described be 0.18-0.25m/s for obtain the speed that the scanned imagery device of two dimensional image moves simultaneously.

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