Built-in self-test circuit and method for liquid crystal display source driver

Built-in self-test circuit and method for liquid crystal display source driver

  • CN 102,237,026 A
  • Filed: 09/10/2010
  • Published: 11/09/2011
  • Est. Priority Date: 04/21/2010
  • Status: Active Application
First Claim
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1. a built-in self-test circuit is characterized in that, it is used for a LCD and comes Source drive, and this built-in self-test circuit comprises:

  • A plurality of digital analog converters;

    A plurality of impact dampers, wherein each impact damper of a plurality of impact dampers is couple to an other digital analog converter of a plurality of digital analog converters, and at least one impact damper reconfigurable be a comparer;

    One first input signal node, it is couple to this comparer, and is configured to supply one first input signal, and it is a predetermined reference voltage level;

    AndOne second input signal node, it is couple to this comparer, and is configured to supply one second input signal, and it is the test offset voltage in a test specification.

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