High-temperature low-pressure aging test method

High-temperature low-pressure aging test method

  • CN 104,655,968 A
  • Filed: 03/17/2015
  • Published: 05/27/2015
  • Est. Priority Date: 03/17/2015
  • Status: Active Application
First Claim
Patent Images

1. a high-temperature low-pressure aging testing method, is characterized in that, said method comprising the steps of:

  • S100;

    clean all parts for testing, and dry having cleaned the rear placement T1 time;

    Described parts comprise insulation sample, artificial tip, base for supporting and the cavity inner wall for high-temperature low-pressure ageing test apparatus;

    S200;

    the test cavity insulation sample of fitting artificial tip being put into test unit, described test unit is with valve interface, and described valve interface is used for being connected with external gas valve;

    S300;

    will vacuumize in described test cavity and be filled with SF 6gas;

    S400;

    carry out sealing detection, and described test unit is heated up;

    S500;

    pressurize to described test cavity, records the firing potential of described insulation sample by shelf depreciation apparatus measures;

    S600;

    use transformer to boost, for the first time hierarchical selection firing potential;

    Carry out sealing detection every the T2 time afterwards, then carry out the boost process of a certain voltage U, until puncture;

    Described T2 and U is arranged according to test design;

    S700;

    after each boosting, carries out shelf depreciation, a dielectric dissipation factor to described test unit and tests;

    Gas is got to described test unit inside simultaneously, carry out the measurement of gas chromatography and infrared spectrum;

    S800;

    experimental result is analyzed.

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