Anti- short-circuit signal tests probe

Anti- short-circuit signal tests probe

  • CN 104,714,062 B
  • Filed: 12/13/2013
  • Issued: 08/13/2019
  • Est. Priority Date: 12/13/2013
  • Status: Active Grant
First Claim
Patent Images

1. a kind of anti-short-circuit signal tests probe, it is applied in IC test, the anti-short-circuit signal test probe includes testThe lower end head of probe, the test probe is used to touch a pin foot of part to be measured, and the part to be measured is with intensive pin footChip, which is characterized in that the anti-short-circuit signal tests probe further include:

  • Insulating trip, both ends bend downward to form two side arms along its ontology, and the intermediate position of the insulating trip is sheathed on the surveyNeedle is soundd out, the two side arms are located at the two sides of the test probe, the two side arms lower end and the test end of probeIt is in close contact, the two side arms lower end is longer than the head of the test probe, and the thickness of the two side arms of the insulating trip is less than instituteThe distance between pin foot is stated, the insulating trip has elasticity.

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