Improved scanning method for scanning probe microscope

Improved scanning method for scanning probe microscope

  • CN 105,241,908 A
  • Filed: 08/28/2015
  • Published: 01/13/2016
  • Est. Priority Date: 08/28/2015
  • Status: Active Application
First Claim
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1. the scanning probe microscopy scan method improved, it is characterized in that:

  • scanning probe microscopy is in the interaction information of the forward scan process acquisition probe and sample that need collection signal, and do not needing the empty scan control method of backhaul that scanning process passes through improvement that returns of collection signal, make probe weaken with the interaction of sample room or probe is separated completely with sample.

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