A kind of required dislocation automated analysis method of crystal geometry based on synchrotron radiation

A kind of required dislocation automated analysis method of crystal geometry based on synchrotron radiation

  • CN 106,055,899 B
  • Filed: 06/01/2016
  • Issued: 07/03/2018
  • Est. Priority Date: 06/01/2016
  • Status: Active Grant
First Claim
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1. a kind of required dislocation automated analysis method of crystal geometry based on synchrotron radiation, which is characterized in that including following stepSuddenly:

  • Step 1:

    Collection of illustrative plates processing is carried out to the original figure spectrum tested using synchrotron radiation microcell Laue diffraction, obtains two-valueChange collection of illustrative plates, diffraction spot calibration information and crystal orientation information;

    It is as follows:

    1) to being fitted using the background of original figure spectrum that synchrotron radiation microcell Laue diffraction is tested, and original graph is usedSpectrum subtracts fitting rear backdrop, collection of illustrative plates after being fitted;

    2) formula is utilized

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