Measuring arrangement for reflection measurement

Measuring arrangement for reflection measurement

  • CN 106,574,866 A
  • Filed: 06/22/2015
  • Published: 04/19/2017
  • Est. Priority Date: 08/01/2014
  • Status: Active Application
First Claim
Patent Images

1. a kind of for the exhausted of detection sample (04,21,42,54,66) in the production process of sample (04,21,42,54,66)Measurement apparatus to reflectance spectrum, it includes:

  • Light source, it is used to produce measurement light;

    Homogenizer, it is used to produce the uniform space Illumination Distribution of measurement light;

    Movable reflector (6,16,39,52,59,62);

    WithReceptor (07,22,37,53), it is used to collect from the sample (04,21,42,54,66) and/or the reflector(6,16,39,52) the measurement light of reflection,Characterized in that, being applied not only to reference measure and for the reflector (6,16,39,52,59,62) of sample measurementThe same side with the light source of the sample (04,21,42,54,66) is positioned in observation optical path and is configured in, to incite somebody to actionThe measurement light of reflection imports to the receptor (07,22,37,53).

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