Measuring device for reflection measurement

Measuring device for reflection measurement

  • CN 106,574,866 B
  • Filed: 06/22/2015
  • Issued: 08/10/2021
  • Est. Priority Date: 08/01/2014
  • Status: Active Grant
First Claim
Patent Images

1. A measuring device for detecting an absolute reflectance spectrum of a sample (04, 21, 42, 54, 66) during production of the sample (04, 21, 42, 54, 66), comprising:

  • a light source for generating measurement light;

    a homogenizer for producing a uniform spatial illuminance distribution of the measurement light;

    a movable reflector (6, 16, 39, 59,

         62); and

    a receiver (07, 22,

         37) for collecting measurement light reflected from the sample (04, 21, 42,

         66) and/or the reflector (6, 16,

         39),characterized in that the reflector (6, 16, 39, 59,

         62) for both reference and sample measurements is positioned in the observation beam path and arranged on the same side of the sample (04, 21, 42,

         66) as the light source in order to direct reflected measurement light to the receiver (07, 22,

         37), the homogenizer being a single hollow body diffusely reflective at its inner surface (02), having a single light exit opening (03,

         14) and comprising the light source, wherein the measurement light is arranged to exit from the light exit opening (03,

         14) to the reflector (6, 16, 39, 59,

         62) and/or the sample (04, 21, 42,

         66).

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