Solar cell loss parameter measurement and analysis system and use method

Solar cell loss parameter measurement and analysis system and use method

  • CN 108,462,469 B
  • Filed: 03/06/2018
  • Issued: 12/11/2020
  • Est. Priority Date: 03/06/2018
  • Status: Active Grant
First Claim
Patent Images

1. A solar cell loss parameter measurement and analysis system comprises a test light source, a convex lens, a chopper, a monochromator, a filtering system, a camera bellows and a lock-in amplifier, wherein the test light source, the convex lens, the chopper, the monochromator, the filtering system and the camera bellows are sequentially arranged on a test bench and positioned on the same light path;

  • the monochromator and the phase-locked amplifier are respectively connected with the control system;

    the device is characterized in that a standard sample test bench, an integrating sphere and a temperature control sample chamber are sequentially arranged in a dark box in a parallel mode, a light inlet slit is formed in the side wall of the dark box at the position collinear with the light ray incidence ends of the standard sample test bench, the integrating sphere and the temperature control sample chamber, and the temperature control sample chamber and a light filtering system are arranged in a collinear mode;

    two parallel slide rails are arranged between the filtering system and the camera bellows, guide rails are connected in the slide rails in a sliding manner, and the guide rails comprise a first light path adjusting guide rail and a second light path adjusting guide rail which are arranged between the filtering system and the camera bellows;

    reflectors are fixed on the first light path adjusting guide rail and the second light path adjusting guide rail, and the reflectors and the light filtering system are located on the same plane;

    the reflector comprises a first reflector and a second reflector which are fixed on the first light path adjusting guide rail, and a third reflector and a fourth reflector which are fixed on the second light path adjusting guide rail;

    the reflecting surfaces of the first reflector and the third reflector face the light filtering system;

    the reflecting surfaces of the second reflecting mirror and the fourth reflecting mirror face the first reflecting mirror and the third reflecting mirror respectively;

    when the first light path adjusting guide rail slides to the position where the first reflector is collinear with the temperature control sample chamber, reflected light of the second reflector is incident into a light incident end of the standard sample test board;

    when the second light path adjusting guide rail slides to the position where the third reflector is collinear with the temperature control sample chamber, reflected light of the fourth reflector is incident into a light incident hole of the integrating sphere;

    a bias light source and a standard light source are arranged on the side wall of the camera bellows, the bias light source is arranged above the light inlet ends of the standard sample test board and the temperature control sample chamber, the standard light source is arranged above the light outlet end of the temperature control sample chamber, and the light output end of the standard light source is provided with a light intensity and illumination tester;

    the light output ends of the standard sample test board, the integrating sphere and the temperature control sample chamber and the signal output end of the chopper are respectively connected with the phase-locked amplifier;

    in the testing process, light emitted by a testing light source is changed into modulated light with a certain frequency through a chopper and then is emitted into a monochromator, meanwhile, the chopper outputs a frequency reference signal to a phase-locked amplifier, the phase-locked amplifier inputs the frequency reference signal into a control system, and an instrument control module of the phase-locked amplifier is controlled by the control system to control a grating stepping motor of the monochromator, so that monochromatic light with a certain wavelength of 300nm-1200nm is generated;

    the monochromatic light forms monochromatic modulation light to be emitted into a temperature control sample chamber in a dark box after a secondary spectrum is filtered by a light filtering system, and meanwhile, a bias light source irradiates a standard solar panel and inputs information into a control system through a phase-locked amplifier to be used as reference data;

    the control system calls the data acquisition module and the data analysis module to acquire and analyze the information transmitted by the phase-locked amplifier, so that the corresponding wavelength and spectrum response relation and surface reflectivity data are generated through operation, the generated data are curved through the graphic processing module, and a loss analysis result is output.

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