Cloud processing formula decodes mechanism

Cloud processing formula decodes mechanism

  • CN 109,788,294 A
  • Filed: 12/27/2018
  • Published: 05/21/2019
  • Est. Priority Date: 12/27/2018
  • Status: Active Application
First Claim
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1. a kind of cloud processing formula AVC decodes mechanism, the structure includes:

  • Cloud processing equipment, setting beyond the clouds, for realizing the prediction decoding equipment in AVC decoding system and convert decoding device;

    AVC decodes system, including prediction decoding equipment, converts decoding device, the equipment that reorders and fragment decoding device, described pre-It surveys decoding device, the transformation decoding device, described reorder equipment and the fragment decoding device is sequentially connected;

    Parameter analysis of electrochemical equipment, setting are connect, for parsing in AVC decoding main body with the transformation decoding deviceThe bit error rate of transformation decoding device output data is stated, and is exported as target error rate;

    The fragment decoding device is connect with the Parameter analysis of electrochemical equipment, for determining the ginseng directly proportional to the target error rateQuantity is examined, the quantity is the quantity of the periphery block type of block Decoded Reference in the fragment decoding device;

    In the distribution decoding device, a frame image is made of multiple fragments, and each fragment is made of multiple rows, every a line byMultiple pieces of compositions;

    Rate checks equipment, connect with fragment decoding device, for checking the current data processing rate of fragment decoding device, withIt is exported as currently processed rate;

    Signal discharge device checks that equipment is connect with the rate, for setting in the currently processed rate lower than fragment decodingWhen the lower limit value of standby default processing speed range, the sluggish order of processing is issued, otherwise, issues processing normal command;

    Self-test processing equipment is connect with the signal discharge device, for when receiving the sluggish order of the processing, to fragmentThe memory usage of decoding device is checked, is exported inspection result as the first utilization rate;

    Multiple temperature sensing units are separately positioned on the inside of fragment decoding device, and the multiple temperature sensing unit is describedThe spread geometry of the inside of fragment decoding device and the shape of the fragment decoding device match, each temperature sensing unitFor incuding the temperature of its position to export as scene temperature;

    Multiple electromagnetic exposure detection units are separately positioned on the integrated circuit board where fragment decoding device, the multiple electricitySpread geometry of the magnetic leak detection unit on the integrated circuit board is zigzag, each electromagnetic exposure detection unit is used forElectromagnetic exposure value where detecting it at position of integrated circuit board as live leakage value to export;

    Temperature analysis equipment is arranged on the integrated circuit board, connect respectively with the multiple temperature sensing unit, for connecingMultiple scene temperatures that the multiple temperature sensing unit exports respectively are received, and weighted average is executed to the multiple scene temperatureOperation is to obtain device temperature value;

    Electromagnetic exposure identifies equipment, is arranged on the integrated circuit board, connects respectively with the multiple electromagnetic exposure detection unitIt connects, the multiple live leakage values exported respectively for receiving the multiple electromagnetic exposure detection unit, and to the multiple sceneLeakage value executes mean operation to obtain circuit board leakage value;

    Liquid crystal display is connect with the temperature analysis equipment and electromagnetic exposure identification equipment respectively, for real respectivelyWhen show the device temperature value and the circuit board leakage value;

    Wherein, the self-test processing equipment is also used to when receiving the processing sluggishness order, according to the currently processed speedThe size of the absolute value of rate and the difference of the lower limit value determines the quantity for executing the data relevant device of trouble shooting;

    Wherein, the data relevant device is the equipment for carrying out data interaction with fragment decoding device, and the determination is performedThe quantity of the data relevant device of trouble shooting is one or more;

    Wherein, it includes;

    to each data phase that the self-test processing equipment, which executes trouble shooting to each data relevant device,The memory usage for closing equipment is checked that export inspection result as the second utilization rate, the quantity of the second utilization rate isIt is one or more.

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