Cantilever for vertical scanning microscope and probe for vertical scan microscope using it

Cantilever for vertical scanning microscope and probe for vertical scan microscope using it

  • CN 1,397,011 A
  • Filed: 09/28/2001
  • Published: 02/12/2003
  • Est. Priority Date: 11/26/2000
  • Status: Active Application
First Claim
Patent Images

1. rectilinear scan microscope cantilever, scan microscope are brought in the physical property infomation that obtains specimen surface before with the nanotube probe of probe by being fixed in cantilever;

  • It is characterized in that;

    on cantilever, be provided for installation region that the base end part of the nanotube that becomes probe is fixed, when relative average sample face becomes the mensuration state with cantilever arrangement, make the short transverse of above-mentioned installation region become the vertical substantially state ground setting of relative sample face.

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