×

Method and device for determining the thickness of material on the basis of high frequencies

Method and device for determining the thickness of material on the basis of high frequencies

  • CN 1,977,143 A
  • Filed: 06/09/2005
  • Published: 06/06/2007
  • Est. Priority Date: 06/30/2004
  • Status: Expired due to Fees
×
×