Method and device for determining the thickness of material on the basis of high frequencies

Method and device for determining the thickness of material on the basis of high frequencies

  • CN 1,977,143 B
  • Filed: 06/09/2005
  • Issued: 02/06/2013
  • Est. Priority Date: 06/30/2004
  • Status: Active Grant
First Claim
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1. be used for seeing through the method that material is determined material thickness, wherein, make the measuring-signal (28) in the GHz frequency range pass at least one times the material (10) of examine and detect this measuring-signal (28) by HF receiver (38) by means of a high frequency transmitter (24)It is characterized in that,From at least two transit time of the measuring-signal measured at the diverse location (20,22) of high frequency transmitter (24) and/or HF receiver (34), determine the material thickness (d) of material (10), wherein, described high frequency transmitter (24) and HF receiver (38) operate on the public first surface (14) of material (10), wherein by means of reflection amboceptor (18) measuring-signal of high frequency transmitter (24) are turned back to HF receiver (38).

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