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  • Carl Zeiss Microscopy LLC et al v. Advanced Microscopy, Inc. IPR of '452 PTAB

    • IPR2016-00051
    • 2800
    • Judge: John A. Hudalla +3
    • Filed: 10/16/2015
    • Institution: 04/18/2016
    • Terminated: 07/08/2016
    • Latest Docket Entry: 07/08/2016
    • PTAB
    • Administrative Judges
    • John A. Hudalla
    • Justin T. Arbes
    • Michael R. Zecher
2
Petitioners
1
Patent Owner
1
Challenged Patent

  • Carl Zeiss Microscopy LLC et al v. Advanced Microscopy, Inc. IPR of '452 PTAB

    • IPR2016-00051
    • 2800
    • Judge: John A. Hudalla +3
    • Filed: 10/16/2015
    • Institution: 04/18/2016
    • Terminated: 07/08/2016
    • Latest Docket Entry: 07/08/2016
    • PTAB
    • Administrative Judges
    • John A. Hudalla
    • Justin T. Arbes
    • Michael R. Zecher
PTAB Petition | Rpx Insight
View Petition
Cause of Action
Inter Partes Review
Administrative Judges
John A. Hudalla
Justin T. Arbes
Michael R. Zecher
  • Patent Information
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