System and method for testing memory
First Claim
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1. An information handling system comprising:
- a BIOS having a test management module;
a memory;
the BIOS in communication with the memory and operable to test the memory;
the test management module operable to;
divide the memory into a base memory block and a plurality of memory test blocks; and
test the base memory block and test a selected memory test block during a boot operation.
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Abstract
A system and method for reducing the amount of time for a boot operation is provided that includes a test management module that divides the memory into multiple test blocks and then selects a limited number of test blocks to test during a boot operation, thereby decreasing the overall amount of memory test time.
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Citations
20 Claims
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1. An information handling system comprising:
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a BIOS having a test management module;
a memory;
the BIOS in communication with the memory and operable to test the memory;
the test management module operable to;
divide the memory into a base memory block and a plurality of memory test blocks; and
test the base memory block and test a selected memory test block during a boot operation. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A test management module for an information handling system comprising:
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a test block assignment module operable to divide a memory into a base memory block and a plurality of sequential memory test blocks;
a test block pointer operable to record the most recently tested memory test block;
a trigger condition indicator operable to determine whether a trigger condition exists; and
the test management module operable to test the base memory block and a selected memory test block during a boot operation. - View Dependent Claims (13, 14, 15)
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16. A method to decrease boot time in a cold boot of an information handling system, the method comprising:
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dividing a memory into a base memory block and a plurality of memory test blocks;
selecting a memory test block for testing;
testing the base memory block;
testing the memory test block. - View Dependent Claims (17, 18, 19, 20)
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Specification