Positioning device for a test element
First Claim
1. An analysis system having a positioning device for a test element, the positioning device comprising:
- a support surface to support the test element;
a position-specific surface configuration on the test element;
a first switch component serving as a reference;
wherein the first switch component is sitting on the support surface;
a second switch component which is arranged parallel to the first switch component, wherein the second switch component sits on the position-specific surface configuration, such that the second switch component can be displaced perpendicular to the support surface depending on the configuration of the test element; and
a switch, wherein the switch can be changed from an off position to an on position depending on a displacement of the second switch component relative to the first switch component.
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Accused Products
Abstract
The invention relates an analysis system having a positioning device for positioning a test element and a method for positioning the test element in the analysis system. The positioning device has a support surface for supporting the test element. A first switch component sits on the support element. A second switch component is positioned parallel to the first switch component. A connection is established when the second switch component is positioned in recess on the test element due to the displacement of the second switch component relative to the first switch component.
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Citations
23 Claims
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1. An analysis system having a positioning device for a test element, the positioning device comprising:
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a support surface to support the test element;
a position-specific surface configuration on the test element;
a first switch component serving as a reference;
wherein the first switch component is sitting on the support surface;
a second switch component which is arranged parallel to the first switch component, wherein the second switch component sits on the position-specific surface configuration, such that the second switch component can be displaced perpendicular to the support surface depending on the configuration of the test element; and
a switch, wherein the switch can be changed from an off position to an on position depending on a displacement of the second switch component relative to the first switch component. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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19. A method for positioning a test element in an analysis system, the method comprising:
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providing a support surface for positioning the test element in the analysis system;
positioning a first switch component on the support surface, wherein the first a first switch component acts as a reference;
arranging a second switch component parallel to the first switch component;
providing a position specific surface configuration on the test strip;
changing the position of the test element such that the second switch component undergoes a defined displacement relative to the first switch component and positioned into the position specific surface configuration on the test strip; and
closing of an electric switch based on the defined displacement of the second switch component relative to the first switch component. - View Dependent Claims (20, 21, 22, 23)
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Specification