Positioning device for a test element
First Claim
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1. An analysis system having a positioning device for a test element, the positioning device comprising:
- a support surface to support the test element;
a position-specific surface configuration on the test element;
a first switch component serving as a reference;
wherein the first switch component is sitting on the support surface adjacent the test element or on a reference or a reference surface of the test element arranged on the support surface;
a second switch component which is arranged parallel to the first switch component, wherein the second switch component sits on the position-specific surface configuration, such that the second switch component can be displaced perpendicular to the support surface depending on the configuration of the test element; and
a switch, wherein the switch can be changed from an off position to an on position depending on a displacement of the second switch component relative to the first switch component and a plane on which the first switch component sits, said plane serving as a reference plane with respect to which the switching operation is performed.
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Abstract
The invention relates an analysis system having a positioning device for positioning a test element and a method for positioning the test element in the analysis system. The positioning device has a support surface for supporting the test element. A first switch component sits on the support element. A second switch component is positioned parallel to the first switch component. A connection is established when the second switch component is positioned in recess on the test element due to the displacement of the second switch component relative to the first switch component.
12 Citations
18 Claims
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1. An analysis system having a positioning device for a test element, the positioning device comprising:
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a support surface to support the test element; a position-specific surface configuration on the test element; a first switch component serving as a reference;
wherein the first switch component is sitting on the support surface adjacent the test element or on a reference or a reference surface of the test element arranged on the support surface;a second switch component which is arranged parallel to the first switch component, wherein the second switch component sits on the position-specific surface configuration, such that the second switch component can be displaced perpendicular to the support surface depending on the configuration of the test element; and a switch, wherein the switch can be changed from an off position to an on position depending on a displacement of the second switch component relative to the first switch component and a plane on which the first switch component sits, said plane serving as a reference plane with respect to which the switching operation is performed. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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Specification