Method and device for the subjective determination of abberations of higher order
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Abstract
The invention relates to a device for the subjective determination of aberrations of higher orders Xi in an optical system, in particular in an eye (5), comprising at least one observation channel (15) into which defined plates (20) can be introduced, the individual plates (20) having optically active structures (21) which correspond to a defined Zernike polynomial and to a defined amplitude, at least one order Xi of the Zernike polynomial being greater than two.
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Citations
27 Claims
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1-10. -10. (canceled)
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11. A device for a subjective determination of aberrations of higher orders in an optical system, the device comprising:
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an observation channel; and
a plurality of individual plates configured to be introduced into the observation channel, each plate having optically active structures corresponding to a defined Zernike polynomial and to a defined amplitude of the defined Zernike polynomial, the defined Zernike polynomial having an order greater than two. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23)
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24. A method for the subjective determination of an aberration of a special higher order X in an optical system, comprising:
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in a first step, introducing a first plate into an observation channel of the optical system, the plate having optically active structures corresponding to a defined Zernike polynomial having an order X and to a defined amplitude of the defined Zernike polynomial, the order X being greater than 2;
in a second step, subjectively assessing a current wave deformation of the order X; and
in a third step repeating the first step with a second plate of different amplitude correction of the defined Zernike polynomial and repeating the second step of the subjective determination so as to select one of the first and second plates that subjectively best compensates the aberration of the special higher order X. - View Dependent Claims (25)
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26. A method for the subjective determination of aberrations of special higher orders X1 to Xn in an optical system, comprising:
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in a first step, introducing a first plate into an observation channel of the optical system, the plate having optically active structures corresponding to a defined Zernike polynomial having an order X1 and to a defined amplitude of the defined Zernike polynomial, the order X1 being greater than 2;
in a second step, subjectively assessing a current wave deformation of the order X1; and
in a third step repeating the first step with a second plate of different amplitude correction of the defined Zernike polynomial and repeating the second step of the subjective determination so as to select one of the first and second plates that subjectively best compensates the aberration of the special higher order X1 in a fourth step, successively repeating the first and second steps for each defined Zernike polynomial having an order Xn, wherein Xn is greater than X1. - View Dependent Claims (27)
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Specification