Aid device for inspection system and display method therefor
First Claim
1. An aid device for an inspection system, said inspection system serving to obtain waveform data from an inspection object, to calculate a value of a characteristic quantity that characterizes said inspection object and to thereby make a judgment whether said inspection object is normal or abnormal, said aid device comprising:
- selecting means for selecting one or more characteristic quantities and one or more parameters;
calculating means for calculating a value for given waveform data by using specified combinations of the selected characteristic quantities and parameters; and
display means for displaying a graph based on results of calculation by said calculating means, said graph having at least two axes, each of said two axes being formed by one selected from the group consisting of said one or more characteristic quantities and said one or more parameters selected by said selecting means;
wherein said aid device serves to determine at least either of an effective characteristic quantity for said judgment and a parameter for calculating a value of said effective characteristic quantity.
1 Assignment
0 Petitions
Accused Products
Abstract
An aid device is set to an inspection system for obtaining waveform data from an inspection object, calculating a value of a characteristic quantity that characterizes the inspection object and making a judgment whether the inspection object is normal or abnormal. The aid device selects one or more characteristic quantities and one or more parameters, calculates a value by using specified combinations of the selected characteristic quantities and parameters to obtain calculation results, and displays a graph based on each of the calculation results for the specified combinations. The graph has at least two axes, each representing a characteristic quantity set or a parameter set and makes a display by varying density, color, height or size corresponding to the results of the calculation.
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Citations
7 Claims
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1. An aid device for an inspection system, said inspection system serving to obtain waveform data from an inspection object, to calculate a value of a characteristic quantity that characterizes said inspection object and to thereby make a judgment whether said inspection object is normal or abnormal, said aid device comprising:
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selecting means for selecting one or more characteristic quantities and one or more parameters;
calculating means for calculating a value for given waveform data by using specified combinations of the selected characteristic quantities and parameters; and
display means for displaying a graph based on results of calculation by said calculating means, said graph having at least two axes, each of said two axes being formed by one selected from the group consisting of said one or more characteristic quantities and said one or more parameters selected by said selecting means;
wherein said aid device serves to determine at least either of an effective characteristic quantity for said judgment and a parameter for calculating a value of said effective characteristic quantity. - View Dependent Claims (2, 3, 4, 5)
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6. A display method for an aid device for an inspection system, said inspection system serving to obtain waveform data from an inspection object, to calculate a value of a characteristic quantity that characterizes said inspection object and to thereby make a judgment whether said inspection object is normal or abnormal, said aid device serving to determine at least either of an effective characteristic quantity for said judgment and a parameter for calculating value of said effective characteristic quantity, said method comprising the steps of:
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selecting one or more characteristic quantities and one or more parameters;
calculating a value by using specified combinations of the selected characteristic quantities and parameters to thereby obtain calculation results; and
displaying a graph based on each of said calculation results for said specified combinations, said graph having at least two axes, each of said two axes being formed by one selected from said selected characteristic quantities and parameters. - View Dependent Claims (7)
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Specification