SEMICONDUCTOR COMPONENT WITH DYNAMIC BEHAVIOR
First Claim
1. A semiconductor component comprising:
- a semiconductor body having a first side and a second side;
a drift zone;
a first semiconductor zone doped complementarily to the drift zone and adjacent to the drift zone in a direction of the first side;
a second semiconductor zone of the same conduction type as the drift zone and adjacent to the drift zone in a direction of the second side;
at least two trenches arranged in the semiconductor body and extending into the semiconductor body proceeding from the first side in a vertical direction into the drift zone and arranged at a distance from one another in a lateral direction of the semiconductor body; and
a field electrode arranged in the at least two trenches adjacent to the drift zone,wherein the at least two trenches are arranged at a distance from the second semiconductor zone in the vertical direction; and
wherein a distance between the trenches and the second semiconductor zone is greater than 1.5 times the mutual distance between the trenches, and wherein a doping concentration of the drift zone in a section between the trenches and the second semiconductor zone differs by at most 35% from a minimum doping concentration in a section between the trenches.
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Accused Products
Abstract
One embodiment provides a semiconductor component including a semiconductor body having a first side and a second side and a drift zone; a first semiconductor zone doped complementarily to the drift zone and adjacent to the drift zone in a direction of the first side; a second semiconductor zone of the same conduction type as the drift zone adjacent to the drift zone in a direction of the second side; at least two trenches arranged in the semiconductor body and extending into the semiconductor body and arranged at a distance from one another; and a field electrode arranged in the at least two trenches adjacent to the drift zone. The at least two trenches are arranged at a distance from the second semiconductor zone in the vertical direction, a distance between the trenches and the second semiconductor zone is greater than 1.5 times the mutual distance between the trenches, and a doping concentration of the drift zone in a section between the trenches and the second semiconductor zone differs by at most 35% from a minimum doping concentration in a section between the trenches.
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Citations
20 Claims
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1. A semiconductor component comprising:
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a semiconductor body having a first side and a second side; a drift zone; a first semiconductor zone doped complementarily to the drift zone and adjacent to the drift zone in a direction of the first side; a second semiconductor zone of the same conduction type as the drift zone and adjacent to the drift zone in a direction of the second side; at least two trenches arranged in the semiconductor body and extending into the semiconductor body proceeding from the first side in a vertical direction into the drift zone and arranged at a distance from one another in a lateral direction of the semiconductor body; and a field electrode arranged in the at least two trenches adjacent to the drift zone, wherein the at least two trenches are arranged at a distance from the second semiconductor zone in the vertical direction; and wherein a distance between the trenches and the second semiconductor zone is greater than 1.5 times the mutual distance between the trenches, and wherein a doping concentration of the drift zone in a section between the trenches and the second semiconductor zone differs by at most 35% from a minimum doping concentration in a section between the trenches. - View Dependent Claims (2, 9, 10, 11, 12, 13, 14, 15)
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3. A semiconductor component comprising:
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a semiconductor body having a first side and a second side, a drift zone; a first semiconductor zone doped complementarily to the drift zone and adjacent to the drift zone in a direction of the first side; a second semiconductor zone of the same conduction type as the drift zone adjacent to the drift zone in a direction of the second side; at least two trenches arranged in the semiconductor body and extending into the semiconductor body proceeding from the first side in a vertical direction right into the drift zone and arranged at a distance from one another in a lateral direction of the semiconductor body; and a field electrode arranged in the at least two trenches adjacent to the drift zone; wherein a distance between the trenches and the second semiconductor zone and a doping concentration of the drift zone in the section between the trenches and the second semiconductor zone are coordinated with one another in such a way that an integral of the doping concentration of the drift zone in a vertical direction of the semiconductor body between the trenches and the second semiconductor zone is greater than or equal to 1.5 times the breakdown charge of the semiconductor material of the drift zone. - View Dependent Claims (4, 5, 6, 7, 8)
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16. A method of forming a semiconductor component comprising:
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providing a semiconductor body having a first side and a second side; forming a drift zone; forming a first semiconductor zone doped complementarily to the drift zone and adjacent to the drift zone in a direction of the first side; forming a second semiconductor zone of the same conduction type as the drift zone and adjacent to the drift zone in a direction of the second side; arranging at least two trenches in the semiconductor body and extending into the semiconductor body proceeding from the first side in a vertical direction into the drift zone and at a distance from one another in a lateral direction of the semiconductor body; arranging a field electrode in the at least two trenches adjacent to the drift zone, arranging the at least two trenches at a distance from the second semiconductor zone in the vertical direction; arranging the trenches and the second semiconductor zone such that a distance between them is greater than 1.5 times the mutual distance between the trenches; and providing a doping concentration of the drift zone in a section between the trenches and in the second semiconductor zone such that they differ by at most 35% from a minimum doping concentration in a section between the trenches. - View Dependent Claims (17, 18, 19, 20)
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Specification