PROBE CIRCUIT, MULTI-PROBE CIRCUIT, TEST APPARATUS, AND ELECTRIC DEVICE
First Claim
1. A probe circuit provided in an electronic device that includes a circuit which is under test and outputs a response signal corresponding to an input signal in synchronization with an operation clock, comprising:
- a sampling clock supplying section that outputs a sampling clock having a predetermined frequency; and
a sampling section that outputs, outside the electronic device, a probe output signal of which frequency is lower than a frequency of the response signal and which corresponds to a sampling result obtained by sampling the response signal using the sampling clock;
wherein the response signal has a prescribed signal pattern repeated with a predetermined recurrence period, andthe sampling clock supplying section outputs the sampling clock of which relative phase with respect to the signal pattern sequentially changes in each recurrence period.
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Accused Products
Abstract
A probe circuit is provided in an electronic device that includes a circuit which is under test and outputs a response signal corresponding to an input signal in synchronization with an operation clock. The probe circuit includes a sampling clock supplying section that outputs a sampling clock having a predetermined frequency, and a sampling section that outputs, outside the electronic device, a probe output signal of which frequency is lower than a frequency of the response signal and which corresponds to a sampling result obtained by sampling the response signal using the sampling clock. The response signal has a prescribed signal pattern repeated with a predetermined recurrence period, and the sampling clock supplying section outputs the sampling clock of which relative phase with respect to the signal pattern sequentially changes in each recurrence period.
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Citations
18 Claims
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1. A probe circuit provided in an electronic device that includes a circuit which is under test and outputs a response signal corresponding to an input signal in synchronization with an operation clock, comprising:
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a sampling clock supplying section that outputs a sampling clock having a predetermined frequency; and a sampling section that outputs, outside the electronic device, a probe output signal of which frequency is lower than a frequency of the response signal and which corresponds to a sampling result obtained by sampling the response signal using the sampling clock; wherein the response signal has a prescribed signal pattern repeated with a predetermined recurrence period, and the sampling clock supplying section outputs the sampling clock of which relative phase with respect to the signal pattern sequentially changes in each recurrence period. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. An electronic device, comprising:
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a circuit that is under test and outputs a response signal corresponding to an input signal in synchronization with an operation clock; and a probe circuit that includes; a sampling clock supplying section that outputs a sampling clock having a predetermined frequency; and a sampling section that outputs, outside the electronic device, a probe output signal of which frequency is lower than a frequency of the response signal and which corresponds to a sampling result obtained by sampling the response signal using the sampling clock; wherein the response signal has a prescribed signal pattern repeated with a predetermined recurrence period, and the sampling clock supplying section outputs the sampling clock of which relative phase with respect to the signal pattern sequentially changes in each recurrence period.
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Specification