Process for sorting integrated circuit devices
First Claim
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1. An integrated circuit manufacturing process for separating integrated circuit devices for enhanced reliability testing from a group of integrated circuit devices, the integrated circuit devices each having a substantially unique identification code, the process comprising:
- storing a flag in connection with the identification code of each of the integrated circuit devices in a group indicating if each integrated circuit device needs enhanced reliability testing;
reading the identification code of each of the integrated circuit devices in the group;
accessing the enhanced reliability testing flag stored in connection with each of the identification codes for each of the integrated circuit devices in the group;
sorting the integrated circuit devices in the group from their enhanced reliability testing flag; and
performing the enhanced reliability testing on the integrated circuit devices needing the enhanced reliability testing.
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Abstract
A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, includes automatically reading the ID code of each of the IC devices and sorting the IC devices in accordance with their automatically read ID codes.
79 Citations
2 Claims
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1. An integrated circuit manufacturing process for separating integrated circuit devices for enhanced reliability testing from a group of integrated circuit devices, the integrated circuit devices each having a substantially unique identification code, the process comprising:
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storing a flag in connection with the identification code of each of the integrated circuit devices in a group indicating if each integrated circuit device needs enhanced reliability testing;
reading the identification code of each of the integrated circuit devices in the group;
accessing the enhanced reliability testing flag stored in connection with each of the identification codes for each of the integrated circuit devices in the group;
sorting the integrated circuit devices in the group from their enhanced reliability testing flag; and
performing the enhanced reliability testing on the integrated circuit devices needing the enhanced reliability testing. - View Dependent Claims (2)
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Specification