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System and method for testing integrated circuits by transient signal analysis

  • US 6,759,864 B2
  • Filed: 06/20/2002
  • Issued: 07/06/2004
  • Est. Priority Date: 06/20/2002
  • Status: Expired due to Term
First Claim
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1. A system for testing an integrated circuit (IC) by transient signal analysis comprising:

  • a comparison circuit configured to generate a comparison signal from an IC transient signal and a reference signal, said IC transient signal being specific to a monitored supply voltage at said IC; and

    circuitry operationally coupled to said comparison circuit, said circultry being configured to manipulate said comparison signal to generate an output waveform, said output waveform being indicative of changes made by said circuitry to said comparison signal for determining if said IC meets a predetermined standard, wherein said circuitry includes a unity-gain inverter in communication with said comparison circuit, said unity-gain inverter being configured to receive and invert said comparison signal.

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