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Alignment methods for imprint lithography

  • US 6,916,584 B2
  • Filed: 08/01/2002
  • Issued: 07/12/2005
  • Est. Priority Date: 08/01/2002
  • Status: Expired due to Term
First Claim
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1. A method of forming a pattern on a substrate comprising:

  • obtaining an imprint lithography system, the imprint lithography system comprising;

    a body;

    a patterned template, wherein the patterned template is substantially transparent to an activating light, wherein the patterned template comprises a first template alignment mark and a second template alignment mark;

    an imprint head coupled to the body, wherein the imprint head is configured to hold the patterned template proximate to the substrate during use; and

    a motion stage coupled to the body, wherein the motion stage is configured to support the substrate, and wherein the motion stage is configured to move the substrate along a plane substantially parallel to the patterned template;

    applying a predetermined amount of an activating light curable liquid to a portion of the substrate, wherein the portion of the substrate comprises a first substrate alignment mark and a second substrate alignment mark;

    rotating the substrate with respect to the template such that the second template alignment mark is substantially aligned with the second substrate alignment mark when the first template alignment mark is aligned with the first substrate alignment mark;

    applying the activating light to the activating light curable liquid, wherein the application of the activating light substantially cures the activating light curable liquid, defining a cured liquid; and

    separating the template from the cured liquid.

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