Flat panel display device with polycrystalline silicon thin film transistor
First Claim
1. A flat panel display device with polycrystalline silicon thin film transistors, comprising:
- a pixel portion divided by gate lines and data lines and comprising thin film transistors driven by signals applied by the gate lines and data lines; and
a driving circuit portion comprising thin film transistors connected to the gate lines and data lines respectively to apply signals to the pixel portion,wherein an average number of grain boundaries of polycrystalline silicon formed in an active channel region of each thin film transistor installed at the driving circuit portion and meet a current direction line is at least one or more less than an average number of grain boundaries of polycrystalline silicon formed in an active channel region of each thin film transistor installed at the pixel portion and meet a current direction line for a unit area of active channels,wherein the polycrystalline silicon grain boundaries formed in the active channel region of each thin film transistor installed at the driving circuit portion include primary polycrystalline silicon grain boundaries that are inclined to the current direction line at an angle of about −
45 to 45°
,wherein the polycrystalline silicon grain boundaries formed in the active channel region of each thin film transistor installed at the pixel portion include primary polycrystalline silicon grain boundaries that are inclined to the current direction line at an angle of about −
45 to 45°
, andwherein the active channel of each thin film transistor installed at the pixel portion is longer than the active channel of each thin film transistor installed at the driving circuit portion.
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Accused Products
Abstract
The present invention relates to a flat panel display device comprising a polycrystalline silicon thin film transistor and provides a flat panel display device having improved characteristics by having a different number of grain boundaries included in polycrystalline silicon thin film formed in active channel regions of a driving circuit portion and active channel regions of pixel portion. This may be achieved by having a different number of grain boundaries included in the polycrystalline silicon thin film formed in active channel regions of a switching thin film transistor and a driving thin film transistor formed in the pixel portion, and by having a different number of grain boundaries included in polycrystalline silicon thin film formed in active channel regions of a thin film transistor for driving the pixel portion for each red, green and blue of the pixel portion. Further, this may be achieved by having a different number of grain boundaries included in polycrystalline silicon formed in active channel regions of an NMOS thin film transistor and a PMOS thin film transistor for forming CMOS transistor used in flat panel display device, thereby constructing a thin film transistor to obtain the improved characteristics for each transistor.
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Citations
6 Claims
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1. A flat panel display device with polycrystalline silicon thin film transistors, comprising:
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a pixel portion divided by gate lines and data lines and comprising thin film transistors driven by signals applied by the gate lines and data lines; and a driving circuit portion comprising thin film transistors connected to the gate lines and data lines respectively to apply signals to the pixel portion, wherein an average number of grain boundaries of polycrystalline silicon formed in an active channel region of each thin film transistor installed at the driving circuit portion and meet a current direction line is at least one or more less than an average number of grain boundaries of polycrystalline silicon formed in an active channel region of each thin film transistor installed at the pixel portion and meet a current direction line for a unit area of active channels, wherein the polycrystalline silicon grain boundaries formed in the active channel region of each thin film transistor installed at the driving circuit portion include primary polycrystalline silicon grain boundaries that are inclined to the current direction line at an angle of about −
45 to 45°
,wherein the polycrystalline silicon grain boundaries formed in the active channel region of each thin film transistor installed at the pixel portion include primary polycrystalline silicon grain boundaries that are inclined to the current direction line at an angle of about −
45 to 45°
, andwherein the active channel of each thin film transistor installed at the pixel portion is longer than the active channel of each thin film transistor installed at the driving circuit portion. - View Dependent Claims (2, 3, 4, 5, 6)
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Specification