Systems and methods for measuring color and contrast in specular reflective devices
First Claim
Patent Images
1. A method of measuring color or contrast of one or more sample interferometric modulators, comprising:
- measuring a spectrum of light reflected from a bright standard located on a substrate;
measuring a spectrum of light reflected from the one or more sample interferometric modulators also located on the substrate; and
determining a reflectance spectrum of the sample interferometric modulators based on the spectra of light reflected from the bright standard and one or more sample interferometric modulators.
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Accused Products
Abstract
Disclosed herein are systems and methods for measuring color and contrast in specular reflective devices such as interferometric modulators. To make color and contrast determinations, light reflected from a specular reflective device may be measured in-line with illumination of the device. The measurements may include measuring the spectra of light reflected from the device being tested as well as from specular bright and dark standards. The spectra may be used to determine a reflectance spectrum and color parameters for the specular reflective device.
391 Citations
43 Claims
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1. A method of measuring color or contrast of one or more sample interferometric modulators, comprising:
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measuring a spectrum of light reflected from a bright standard located on a substrate; measuring a spectrum of light reflected from the one or more sample interferometric modulators also located on the substrate; and determining a reflectance spectrum of the sample interferometric modulators based on the spectra of light reflected from the bright standard and one or more sample interferometric modulators. - View Dependent Claims (4, 5, 6, 7, 8, 9, 12, 13)
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2. A method of measuring color or contrast of one or more sample interferometric modulators, comprising:
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measuring a spectrum of light reflected from a bright standard; measuring a spectrum of light reflected from the one or more sample interferometric modulators; measuring a spectrum of light reflected from a dark standard; and determining a reflectance spectrum of the sample interferometric modulators based on the spectra of light reflected from the bright standard and one or more sample interferometric modulators. - View Dependent Claims (3, 10, 11)
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14. An integrated reflective display element and test standard wafer, comprising:
- a plurality of reflective display elements adapted for use in a display, wherein the reflective display elements are interferometric modulators; and
a bright standard, wherein the reflective display elements and the bright standard are present on a single wafer. - View Dependent Claims (15, 16, 17)
- a plurality of reflective display elements adapted for use in a display, wherein the reflective display elements are interferometric modulators; and
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18. A wafer, comprising:
- a plurality of first means for reflecting light for use in a display, wherein the first means comprises interferometric modulators; and
second means for reflecting light at an intensity greater than light reflected from the first means, wherein the first means and the second means are present on a single wafer. - View Dependent Claims (19)
- a plurality of first means for reflecting light for use in a display, wherein the first means comprises interferometric modulators; and
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20. An in-line lighting and measurement system, comprising:
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an illumination source adapted to illuminate a specularly reflective device; a detector adapted to detect light reflected from the specularly reflective device; a specularly reflective bright standard adapted to specularly reflect light from the illumination source into the detector, thereby providing a reflectance spectrum standard for use in determining a reflectance spectrum of the specularly reflective device; and a specularly reflective dark standard comprising an etalon adapted to specularly reflect light from the illumination source into the detector, thereby providing a second reflectance spectrum standard for use in determining the reflectance spectrum of the specularly reflective device. - View Dependent Claims (21, 22)
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23. A method of determining whether an array of interferometric modulators are suitable for use in a display, comprising:
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determining color parameters for at least some of the interferometric modulators in an un-driven state, a memory dark state, a memory bright state, and an over-driven state; and identifying the array as suitable for use as a display based on said determining. - View Dependent Claims (24, 25, 26)
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27. An integrated interferometric modulator and test standard wafer manufactured by a process that comprises:
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a plurality of material deposition steps; a plurality of patterning steps that define regions for material removal; and a plurality of material removal steps, wherein the patterning steps are used to define a plurality of interferometric modulators and separately at least one reflectivity standard selected from the group consisting of a bright standard and a dark standard. - View Dependent Claims (28, 29)
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30. A method of manufacturing an interferometric modulator array, comprising:
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forming a plurality of interferometric modulators on a substantially transparent substrate; forming a reflectivity standard on the substrate, wherein the reflectivity standard is selected from the group consisting of a bright standard and a dark standard. - View Dependent Claims (31)
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32. A method of measuring color of an interferometric modulator on a substrate, comprising:
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detecting light reflected from the interferometric modulator, determining a first reference reflectivity using a means for reflecting a maximum amount of light also on the substrate; and determining the color of the interferometric modulator from the detected light and first reference reflectivity. - View Dependent Claims (34, 35)
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33. A method of measuring color of an interferometric modulator, comprising:
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detecting light reflected from the interferometric modulator; determining a first reference reflectivity using a means for reflecting a maximum amount of light; determining a second reference reflectivity using a means for reflecting a minimum amount of light; determining the color of the interferometric modulator from the detected light and the first and second reference reflectivities.
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36. An interferometric modulator display comprising a plurality of interferometric modulators identified as suitable for use in the display by:
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detecting light reflected from at least some of the interferometric modulators, wherein the interferometric modulators are located on a substrate; detecting light reflected from a bright standard also located on the substrate; and determining a reflectance spectrum, one or more color parameters, and/or a contrast ratio of the interferometric modulators. - View Dependent Claims (39, 40, 41, 42, 43)
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37. An interferometric modulator display comprising a plurality of interferometric modulators identified as suitable for use in the display by:
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detecting light reflected from at least some of the interferometric modulators; detecting light reflected from a dark standard; and determining a reflectance spectrum, one or more color parameters, and/or a contrast ratio of the interferometric modulators. - View Dependent Claims (38)
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Specification