Method and apparatus for remotely buffering test channels
First Claim
1. An apparatus comprising:
- an isolation buffer provided in a test channel of a test system for testing an electronic device;
a buffer bypass element provided in the test channel between a signal input and output of the isolation buffer; and
a test probe configured to contact the electronic device,wherein the test channel is configured to connect electrically at one end to a tester for controlling testing of the electronic device and terminates at another end in the test probe.
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Accused Products
Abstract
A system is provided to enable leakage current measurement or parametric tests to be performed with an isolation buffer provided in a channel line. Multiple such isolation buffers are used to connect a single signal channel to multiple lines. Leakage current measurement is provided by providing a buffer bypass element, such as a resistor or transmission gate, between the input and output of each buffer. The buffer bypass element can be used to calibrate buffer delay out of the test system by using TDR measurements to determine the buffer delay based on reflected pulses through the buffer bypass element. Buffer delay can likewise be calibrated out by comparing measurements of a buffered and non-buffered channel line, or by measuring a device having a known delay.
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Citations
31 Claims
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1. An apparatus comprising:
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an isolation buffer provided in a test channel of a test system for testing an electronic device; a buffer bypass element provided in the test channel between a signal input and output of the isolation buffer; and a test probe configured to contact the electronic device, wherein the test channel is configured to connect electrically at one end to a tester for controlling testing of the electronic device and terminates at another end in the test probe. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A probe card comprising:
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isolation buffers provided in test channels for testing electronic devices; buffer bypass elements provided in parallel with the isolation buffers, an electrical interface configured to electrically connect the test channels to a tester for controlling testing of the electronic devices; and test probes configured to contact the electronic devices, wherein the electrical interface is electrically connected to the test probes. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20, 21)
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22. An apparatus comprising:
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a signal line configured to connect electrically to a tester for testing electronic devices; a plurality of branches from the signal line to a plurality of test probes configured to contact ones of the electronic devices; isolation buffers, each isolation buffer provided in one of the branches; and buffer bypass elements, each buffer bypass element electrically connected in parallel with one of the isolation buffers. - View Dependent Claims (23, 24, 25, 26, 27, 28, 29, 30, 31)
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Specification