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Apparatus and method for testing a panel of interferometric modulators

  • US 8,027,800 B2
  • Filed: 06/24/2008
  • Issued: 09/27/2011
  • Est. Priority Date: 06/24/2008
  • Status: Active Grant
First Claim
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1. A method of testing a panel comprising a plurality of interferometric modulators, the method comprising:

  • applying a ramped voltage waveform to the plurality of interferometric modulators of the panel; and

    in response to applying the ramped voltage, identifying a first voltage of the ramped voltage waveform at which a first threshold number of the plurality of interferometric modulators of the panel enter a stiction state, wherein with respect to an interferometric modulator that enters the stiction state, a first portion of the interferometric modulator adheres to a second portion of the interferometric modulator.

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