Cantilevers with integrated piezoelectric actuators for probe microscopy

• US 8,321,959 B2
• Filed: 08/09/2010
• Issued: 11/27/2012
• Est. Priority Date: 08/15/2006
• Status: Expired due to Fees

• Current Assignee: Georgia Tech Research Corporation (University System of Georgia)
• Original Assignee: Georgia Tech Research Corporation (University System of Georgia)
• Inventors: Degertekin, Fahrettin Levent
• Primary Examiner(s): NOLAND, THOMAS
• Application Number:
  US12/853,011
• Publication Number:
  US 20100306885A1
• Time in Patent Office: 841 Days
• Field of Search: 731/05, 850 5- 7, 850/33
• US Class Current: 850/1
• CPC Class Codes: G01Q 10/045 Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe
• CPC Class Codes: G01Q 20/04 Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezoelectric gauge
• CPC Class Codes: G01Q 60/38 Probes, their manufacture, or their related instrumentation, e.g. holders

Abstract

An atomic force microscopy sensor includes a substrate, a cantilever beam and an electrostatic actuator. The cantilever beam has a proximal end and an opposite distal end. The proximal end is in a fixed relationship with the substrate and the cantilever beam is configured so that the distal end is in a moveable relationship with respect to the substrate. The electrostatic actuator includes a first electrode that is coupled to the cantilever beam adjacent to the proximal end and a spaced apart second electrode that is in a fixed relationship with the substrate. When an electrical potential is applied between the first electrode and the second electrode, the first electrode is drawn to the second electrode, thereby causing the distal end of the cantilever beam to move.

Claims

1. An atomic force microscopy sensor, comprising:

a. a substrate;

b. a cantilever beam having a proximal end and an opposite distal end, the proximal end in a fixed relationship with the substrate and the cantilever beam is configured so that the distal end is in a moveable relationship with respect to the substrate;

c. a piezoelectric actuator that includes a piezoelectric member affixed to the cantilever beam adjacent to the proximal end so that when an electrical potential is applied to the piezoelectric member, the piezoelectric member will deform along a predetermined dimension, thereby causing the cantilever beam to bend; and

d. a pair of spaced-apart electrodes, a first one of the pair of electrodes coupled to the cantilever beam and a second one of the pair of electrodes in a fixed relationship to the substrate so as to form a capacitor therebetween so that a displacement between the electrodes results in a corresponding capacitance that is indicative of a displacement of the distal end of the cantilever beam.

2. The atomic force microscopy sensor of claim 1, wherein a probe extends from the distal end of the cantilever beam.