Semiconductor structures including polymer material permeated with metal oxide
First Claim
1. A semiconductor device structure comprising:
- at least one trench in an insulative material overlying a substrate; and
metal oxide structures within the at least one trench and comprising at least one of lamellas and cylinders, each of the metal oxide structures substantially equally laterally spaced from at least one other of the metal oxide structures and comprising;
an upper region comprising at least one polymer and a metal oxide; and
a lower region between the upper region and the substrate and comprising at least on other polymer.
7 Assignments
0 Petitions
Accused Products
Abstract
Methods of forming metal oxide structures and methods of forming metal oxide patterns on a substrate using a block copolymer system formulated for self-assembly. A block copolymer at least within a trench in the substrate and including at least one soluble block and at least one insoluble block may be annealed to form a self-assembled pattern including a plurality of repeating units of the at least one soluble block laterally aligned with the trench and positioned within a matrix of the at least one insoluble block. The self-assembled pattern may be exposed to a metal oxide precursor that impregnates the at least one soluble block. The metal oxide precursor may be oxidized to form a metal oxide. The self-assembled pattern may be removed to form a pattern of metal oxide lines on the substrate surface. Semiconductor device structures are also described.
338 Citations
20 Claims
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1. A semiconductor device structure comprising:
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at least one trench in an insulative material overlying a substrate; and metal oxide structures within the at least one trench and comprising at least one of lamellas and cylinders, each of the metal oxide structures substantially equally laterally spaced from at least one other of the metal oxide structures and comprising; an upper region comprising at least one polymer and a metal oxide; and a lower region between the upper region and the substrate and comprising at least on other polymer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 19)
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12. A semiconductor device structure comprising:
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structural domains within at least one trench in an insulative material overlying a substrate, each of the structural domains comprising; a first polymer block of a block copolymer material; and a metal oxide within the first polymer block; and a matrix between the structural domains and the substrate and comprising a second polymer block of the block copolymer material. - View Dependent Claims (13, 14, 15, 16)
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17. A semiconductor device structure comprising:
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an insulative material over a substrate; and substantially equally laterally spaced polymer structures within at least one trench in the insulative material, each of the substantially equally laterally spaced polymer structures comprising; an upper region comprising a metal oxide; and a lower region substantially free of the metal oxide and comprising a polymer. - View Dependent Claims (18, 20)
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Specification