Apparatuses and methods to modify pillar potential
First Claim
Patent Images
1. A method comprising:
- performing a first operation on a first charge storage device in a block of charge storage devices, some of the charge storage devices in the block being associated with a pillar comprising semiconductor material;
inducing drain leakage current in a select gate transistor of the pillar to modify an electrical potential of the pillar; and
performing a second operation on a second charge storage device in the block of charge storage devices.
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Abstract
Apparatus are disclosed, such as a block including a number of strings of charge storage devices, each string including a number of charge storage devices associated with a pillar, and each pillar including semiconductor material. Methods are disclosed, such as a method that includes performing a first operation on a first charge storage device associated with a pillar in the block, modifying an electrical potential of the pillar, and performing a second operation on a second charge storage device in the block. Additional apparatus and methods are described.
20 Citations
35 Claims
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1. A method comprising:
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performing a first operation on a first charge storage device in a block of charge storage devices, some of the charge storage devices in the block being associated with a pillar comprising semiconductor material; inducing drain leakage current in a select gate transistor of the pillar to modify an electrical potential of the pillar; and performing a second operation on a second charge storage device in the block of charge storage devices. - View Dependent Claims (2, 3, 4, 5)
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6. An apparatus comprising:
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a string of charge storage devices comprising a plurality of charge storage devices and a select gate transistor associated with a pillar comprising semiconductor material; a cap comprising semiconductor material and coupled to the pillar to form a p-n junction between the cap and the pillar; a plurality of access lines associated with the string; and a charge pump circuit coupled to the cap and configured to selectively cause drain leakage current to be induced in the select gate transistor to modify an electrical potential of the pillar after a first memory operation and prior to a second memory operation. - View Dependent Claims (7, 8, 9, 10, 11, 12, 13)
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14. A method comprising:
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performing a first read operation on a charge storage device in a block of charge storage devices, each of the charge storage devices in the block being associated with a respective one of a plurality of pillars, each pillar comprising semiconductor material; inducing drain leakage current in a select gate transistor of a selected one of the pillars to modify an electrical potential of the selected pillar; and performing a second read operation on a charge storage device in the block of charge storage devices. - View Dependent Claims (15, 16, 17, 18)
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19. A method comprising:
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performing a first operation on a selected charge storage device in a block of charge storage devices, some of the charge storage devices in the block being associated with a pillar comprising semiconductor material; lowering an electrical potential of the pillar; and performing a read operation on the selected charge storage device in the block of charge storage devices. - View Dependent Claims (20, 21, 22, 23, 24)
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25. A method comprising:
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performing a read operation on a charge storage device in a block of charge storage devices, some of the charge storage devices in the block being associated with a respective one of a plurality of pillars, each pillar comprising semiconductor material; inducing drain leakage current in a select gate transistor of a selected one of the pillars to raise an electrical potential of the selected pillar; and performing an erase operation on a charge storage device in the block of charge storage devices. - View Dependent Claims (26, 27, 28, 29, 30)
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31. A method comprising:
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performing a programming operation on a charge storage device in a block of charge storage devices, some of the charge storage devices in the block being associated with a respective one of a plurality of pillars, each pillar comprising semiconductor material; inducing drain leakage current in a select gate transistor of a selected one of the pillars to modify an electrical potential of the selected pillar; and performing a program verify operation on the charge storage device. - View Dependent Claims (32, 33, 34, 35)
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Specification