Semiconductor device, microcomputer and flash memory
First Claim
1. A semiconductor device on a semiconductor chip, a control voltage generating circuit which generates a control voltage on the basis of control data;
- a circuit using a current source generating a reference current on the basis of said control voltage;
a current measuring transistor whose control terminal is connected to a signal line for providing said control voltage to said reference current source;
an external measuring terminal, connected to a current terminal of said current measuring transistor, for making possible external measurement of a current flowing in said current measuring transistor; and
a memory means which holds said control data and provides them to said control voltage generating circuit.
5 Assignments
0 Petitions
Accused Products
Abstract
A semiconductor device whose characteristics are highly reliably regulated for circuits whose desired characteristics need to be realized without being affect by unevenness in device characteristics is to be provided. A replica MOS transistor for amperage measurement connected to an external measuring terminal is provided. A delay circuit and other circuits whose desired characteristics are to be realized have a constant current source MOS transistor formed in the same process as the replica MOS transistor, and a trimming voltage vtri is commonly applied to the respective gates of the constant current source MOS transistor and the replica MOS transistor. Trimming data determined on the basis of an amperage measured from the external measuring terminal are stored into a memory means such as an electrically rewritable non-volatile memory or the like. The trimming data determine the trimming voltage vtri.
27 Citations
38 Claims
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1. A semiconductor device on a semiconductor chip, a control voltage generating circuit which generates a control voltage on the basis of control data;
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a circuit using a current source generating a reference current on the basis of said control voltage;
a current measuring transistor whose control terminal is connected to a signal line for providing said control voltage to said reference current source;
an external measuring terminal, connected to a current terminal of said current measuring transistor, for making possible external measurement of a current flowing in said current measuring transistor; and
a memory means which holds said control data and provides them to said control voltage generating circuit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21)
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22. A microcomputer including a CPU and other circuits over one semiconductor chip,
wherein said other circuits include a control voltage generating circuit for generating a control voltage on the basis of control data; - a circuit using a current source transistor for generating a reference current on the basis of said control voltage;
a current measuring transistor whose control terminal is connected to a path for supplying said control voltage to said current source transistor;
an external measuring terminal, connected to the current terminal of said current measuring transistor, for making possible external measurement of the current flowing in said current measuring transistor; and
a memory which holds control data and provides them to said control voltage generating circuit. - View Dependent Claims (23, 24, 25, 26, 27, 28, 29, 30)
- a circuit using a current source transistor for generating a reference current on the basis of said control voltage;
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31. A flash memory having over one semiconductor chip an array of non-volatile memory elements whose threshold voltages are made electrically changeable, a program circuit for changing the threshold voltages of said non-volatile memory elements, and a read circuit for reading out stored information in the non-volatile memory elements,
either said program circuit or read circuit or both have a current source MOS transistor, receiving a control voltage, for generating a reference current, said flash memory further including: -
a signal line for providing a control voltage to said current source MOS transistor;
a current measuring, MOS transistor whose control terminal is connected to said signal line;
an external measuring terminal, connected to the current terminal of said current measuring MOS transistor, for making possible external measurement of the current flowing in said current measuring MOS transistor;
a control voltage generating circuit for generating said control voltage on the basis of control data; and
a memory for holding said control data and providing them to said control voltage generating circuit. - View Dependent Claims (32, 33, 34, 35, 37, 38)
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36. A semiconductor integrated circuit, comprising:
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a memory circuit which holds control data;
a voltage generating circuit which generates a control voltage in accordance with the control data;
a plurality of circuits each of which includes a current source circuit generating a reference current in accordance with the control voltage;
a signal line coupled to the voltage generating circuit to commonly provide the control voltage to the respective current source;
a measuring transistor having a control terminal coupled to the signal line and a current terminal; and
an external terminal which is coupled to the current terminal of the measuring transistor and which makes possible external measurement of a current flowing through the measuring transistor.
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Specification