Integrated microcontroller module and method for checking the functionality of an integrated memory of the microcontroller module

• US 20040052149A1
• Filed: 07/09/2003
• Published: 03/18/2004
• Est. Priority Date: 07/09/2002
• Status: Abandoned Application

• Current Assignee: Marcel Maass, Thierry Canaud, Thomas Hanuschek, Till Frohnmuller, Volker Penka
• Original Assignee: Marcel Maass, Thierry Canaud, Thomas Hanuschek, Till Frohnmuller, Volker Penka
• Inventors: Frohnmuller, Till, Penka, Volker, Maass, Marcel, Hanuschek, Thomas, Canaud, Thierry
• Application Number:
  US10/616,114
• Publication Number:
  US 20040052149A1
• Time in Patent Office: Days
• US Class Current: 365/232
• CPC Class Codes: G11C 2029/0401 in embedded memories
• CPC Class Codes: G11C 29/16 using microprogrammed units, e.g. state machines

Abstract

An integrated module contains a microcontroller and a code/data memory, it being possible for an access to the memory and an external data transfer terminal to be controlled by the microcontroller during normal operation. Furthermore, the carrying out of a test sequence for the functional testing of the memory can be controlled by the microcontroller in a test operation. In a method for checking the functionality of the memory, a command sequence on the basis of which the microcontroller controls the carrying out of the test sequence is read into the module externally before the beginning of the test operation. The command sequence is executed on the microcontroller and defect data are stored in a defect data memory under the control of the microcontroller. Therefore, it is possible to carry out a self-test of the memory, but no additional BIST hardware has to be provided for this purpose.

Claims

1. An integrated module, comprising:

an external access terminal;

a memory for storing code and data;

a microcontroller connected to said external access terminal and to said memory, said microcontroller controlling an access to said memory and a data transfer through said external access terminal during normal operation, said microcontroller controlling a performance of a test sequence for functional testing said memory in a test operation of the module; and

a defect data memory for storing defect data under control of said microcontroller, the defect data being generated during the functional testing.

2. The integrated module according to claim 1, further comprising a command memory for storing an externally supplied command sequence and on a basis of the command sequence said microcontroller controls a carrying out of the test sequence.

3. The integrated module according to claim 1, wherein said defect data memory is part of said microcontroller.

4. The integrated module according to claim 2, wherein said command memory is part of said microcontroller.

5. A method for functionally checking a memory of an integrated module, which comprises the steps of:

reading-in a command sequence externally before beginning a test operation, and on a basis of the command sequence a microcontroller controls a carrying out of a test sequence;

executing the command sequence for carrying out the test sequence by the microcontroller; and

storing defect data in a defect data memory under the control of the microcontroller.

6. The method according to claim 5, which further comprises:

making a jump to a start address in an internal command memory after the command sequence is read-in at the beginning of the test operation;

executing the command sequence under the control of the microcontroller proceeding from the start address; and

storing the defect data generated in the defect data memory under the control of the microcontroller; and

reading-out the defect data stored in the defect data memory, under the control of the microcontroller, to outside the integrated module for further evaluation.