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High-gradient recursive locating system

  • US 20040068178A1
  • Filed: 09/17/2002
  • Published: 04/08/2004
  • Est. Priority Date: 09/17/2002
  • Status: Abandoned Application
First Claim
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1. A method for locating a field probe, comprising the steps of:

  • disposing a first group comprising a plurality of first field elements at known locations;

    disposing a second group comprising a plurality of second field elements within an operational space of said first field elements;

    disposing said field probe within an operational space of said second field elements, a first transmitting section being defined by one of a portion of said first group and a portion of said second group, a first receiving section being defined by another of said portion of said first group and a portion of said second group, wherein at least one of said first transmitting section and said first receiving section has at least two members, a second transmitting section being defined by one of said second group and said field probe, a second receiving section being defined by another of said second group and said field probe;

    actuating said first transmitting section and said first receiving section to produce at least one first generated field;

    making a first measurement of said first generated field in said first receiving section;

    responsive to said first measurement calculating a first estimated location of each member of said first transmitting section relative to each member of said first receiving section;

    actuating said second transmitting section and said second receiving section to produce at least one second generated field;

    making a second measurement of said second generated field in said second receiving section;

    responsive to said second measurement calculating a second estimated location of each member of said second transmitting section relative to each member of said second receiving section; and

    using said first estimated location and said second estimated location to calculate a location of said field probe relative to said first field elements.

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