Positioning device for a test element

• US 20050042765A1
• Filed: 08/20/2004
• Published: 02/24/2005
• Est. Priority Date: 08/21/2003
• Status: Active Grant

• Current Assignee: Roche Diabetes Care Inc. (Roche Holding AG)
• Original Assignee: Roche Diagnostics Operations Incorporated (Roche Holding AG)
• Inventors: Hubner, Ute, Schabbach, Michael, Stenkamp, Bernd, Kern, Bernhard
• Granted Patent: US 7,501,097 B2
• Time in Patent Office: Days
• US Class Current: 436/169
• CPC Class Codes: G01N 2035/00039 Transport arrangements specific to flat sample substrates, e.g. pusher blade
• CPC Class Codes: G01N 35/00029 provided with flat sample substrates, e.g. slides G01N35/028 takes precedence

Abstract

The invention relates an analysis system having a positioning device for positioning a test element and a method for positioning the test element in the analysis system. The positioning device has a support surface for supporting the test element. A first switch component sits on the support element. A second switch component is positioned parallel to the first switch component. A connection is established when the second switch component is positioned in recess on the test element due to the displacement of the second switch component relative to the first switch component.

Claims

1. An analysis system having a positioning device for a test element, the positioning device comprising:

a support surface to support the test element;

a position-specific surface configuration on the test element;

a first switch component serving as a reference;

wherein the first switch component is sitting on the support surface;

a second switch component which is arranged parallel to the first switch component, wherein the second switch component sits on the position-specific surface configuration, such that the second switch component can be displaced perpendicular to the support surface depending on the configuration of the test element; and

a switch, wherein the switch can be changed from an off position to an on position depending on a displacement of the second switch component relative to the first switch component.

2. The system according to claim 1, wherein the first switch component is a pin which sits on the support surface.

3. The system according to claim 1, wherein the second switch component is a displaceably mounted journal with a conically tapering end facing towards the test element.

4. The system according to claim 3, wherein the the position-specific surface configuration on the test strip is at least one recess receiving the conically tapering end of the journal.

5. The system according to claim 1, wherein the first switch component is a shoulder arranged alongside the support surface.

6. The system according to claim 5, wherein the shoulder is cuboid or step-shaped.

7. The system according to claim 5, wherein the shoulder and the support surface are made in one piece.

8. The system according to claim 1, wherein the test strip has a reference surface lying on the support surface, such that the first switch component is sitting on the reference surface.

9. The system according to claim 8, wherein the first switch component is a hollow journal which sits on the reference surface of the test element and has a conically tapering end facing towards the test element and with an opening, and the second switch component is a pin with a spherical tip, the pin being spring-mounted in the journal, and the spherical tip protruding partially through the opening and past the conically tapering end of the journal when the spring is extended, and being pressed fully into the journal when the spring is compressed.

10. The system according to claim 9, wherein the surface configuration of the test element is a contour that influences the displacement of the pin depending on the position of the test element.

11. The system according to claim 10, wherein the contour is designed as a groove varying in width and depth on the surface of the test element.

12. The system according to claim 1, wherein the first switch component determines the displacement of a spring plate, and the second switch component transmits its displacement to a contact spring, an electric switch being closed when the contact spring and the spring plate touch.

13. The system according to claim 12, wherein the second switch component engages through an opening in the spring plate.

14. The system according to claim 12, wherein the second switch component has a lateral projection via which the second switch component transmits its displacement to the contact spring.

15. The system according to claim 12, wherein the first switch component determines the displacement of the spring plate by touching the spring plate via a contact surface, the spring plate being prestressed in a direction to the contact surface.

16. The system according to claim 15, wherein the contact surface touches the spring plate on the side facing towards the contact spring, on the side facing away from the contact spring or on both sides of the spring plate.

17. The system according to claim 1, wherein the test element is a capillary slit test element.

18. The system according to claim 1, wherein the test element has a position-specific surface configuration which characterizes a sample application position and a sample analysis position.

19. A method for positioning a test element in an analysis system, the method comprising:

providing a support surface for positioning the test element in the analysis system;

positioning a first switch component on the support surface, wherein the first a first switch component acts as a reference;

arranging a second switch component parallel to the first switch component;

providing a position specific surface configuration on the test strip;

changing the position of the test element such that the second switch component undergoes a defined displacement relative to the first switch component and positioned into the position specific surface configuration on the test strip; and

closing of an electric switch based on the defined displacement of the second switch component relative to the first switch component.

20. The method according to claim 19, wherein the second switch component fixes the test element in a position in which the electric switch is closed.

21. The method according to claim 19, wherein the closing of the electric switch results when an electrical contact is established between a spring plate displaced by the first switch component and a contact spring displaced by the second switch component.

22. The method according to claims 19, wherein the test element in the analysis apparatus is positioned at least in one position with the aid of the switch.

23. The method according to claim 22, wherein the test element in the analysis system is pushed out of a supply container, positioned in a sample application position, positioned in an analysis position, and moved into a storage container.