Endpoint detector for a substrate manufacturing process
First Claim
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1. An apparatus for detecting an endpoint in a substrate processing, comprising:
- a window covering a passage formed through a sidewall of a processing chamber in which the substrate processing is performed, the window transmitting light generated from plasma during the substrate processing;
an analyzing unit for analyzing the light to detect an endpoint of the substrate processing;
a first temperature control unit, thermally coupled to the window, for maintaining the window at a first temperature; and
a second temperature control unit, thermally coupled to an inner surface of the passage, for maintaining the inner surface of the passage at a second temperature, the second temperature being lower than the first temperature.
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Abstract
An endpoint detector has a window, a first temperature control unit, a second temperature control unit and an analyzing unit. The window transmits light emitted from plasma in a processing chamber, and covers a passage through a sidewall of the processing chamber. The first temperature control unit maintains the window at a first temperature. The second temperature control unit maintains an inner surface of the passage at a second temperature, which is lower than the first temperature. The analyzing unit analyzes the light and determines an endpoint of a process in the processing chamber.
9 Citations
22 Claims
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1. An apparatus for detecting an endpoint in a substrate processing, comprising:
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a window covering a passage formed through a sidewall of a processing chamber in which the substrate processing is performed, the window transmitting light generated from plasma during the substrate processing;
an analyzing unit for analyzing the light to detect an endpoint of the substrate processing;
a first temperature control unit, thermally coupled to the window, for maintaining the window at a first temperature; and
a second temperature control unit, thermally coupled to an inner surface of the passage, for maintaining the inner surface of the passage at a second temperature, the second temperature being lower than the first temperature. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 18, 19, 20, 21, 22)
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- 15. The endpoint detector as claimed in claim 15, wherein the cooling channel further comprises a plurality of cooling pins formed in the cooling channel.
Specification