Method And Apparatus For Classification Of Surfaces

• US 20080151233A1
• Filed: 12/29/2005
• Published: 06/26/2008
• Est. Priority Date: 12/30/2004
• Status: Abandoned Application

• Current Assignee: Danmarks Pã¦Dagogiske Universitet
• Original Assignee: Danmarks Pã¦Dagogiske Universitet
• Inventors: Braithwaite, Ian David, Blanke, Mogens
• Application Number:
  US11/722,987
• Publication Number:
  US 20080151233A1
• Time in Patent Office: Days
• US Class Current: 356/237.2
• CPC Class Codes: A47L 2201/06 Control of the cleaning action for autonomous devices; Automatic detection of the surface condition before, during or after cleaning
• CPC Class Codes: G01N 21/47 Scattering, i.e. diffuse reflection G01N21/25, G01N21/41 take precedence G01N21/55 takes precedence
• CPC Class Codes: G01N 21/8806 Specially adapted optical and illumination features
• CPC Class Codes: G01N 21/94 Investigating contamination, e.g. dust G01N21/85 takes precedence

Abstract

A method for optically determining whether a region of a surface is clean or contaminated. The method finds applicability in connection with cleaning robots, for example in pig house cleaning. It comprises the steps of—selecting a first and a second, different narrow band of wavelengths for illuminating the region, —selecting a first class with two-dimensional values (XI, Y I) which corresponds to a clean region and a second class with two-dimensional values (X2, Y2) which corresponds to a contaminated region, where X1 and X2 are values for the reflectance from the region at the first band, and Y1 and Y2 are values for the reflectance from the region at the second band, —illuminating the region with light having the first narrow band of wavelengths and illuminating the region with light having the second narrow band of wavelengths, —measuring the reflected light from the region at the first and the second band to determine the respective reflectance values RI and R2, —assigning the two-dimensional value (R1, R2) to the first class, if there exist a value (X1, Y1)=(R1, R2) and assign the two-dimensional value (RI, R2) to the second class, if there exist a value (X2, Y2)=(R I, R2).

Claims

1. A method for optically determining whether a region of a surface is clean or contaminated, the method comprising the steps of:

selecting a first and a second, different narrow band of wavelengths for illuminating the region,

selecting a first class with two-dimensional values [X1, Y1] that corresponds to a definition as clean for the region and a disjunct second class with two-dimensional values [X2, Y2] that corresponds to a definition as contaminated for the region, where X1 and X2 are values for the reflectance from the region at the first band, and Y1 and Y2 are values for the reflectance from the region at the second band,

illuminating the region with light having the first narrow band of wavelengths and illuminating the region with light having the second narrow band of wavelengths,

measuring the reflected light from the region at the first and the second band to determine the respective reflectance values R1 and R2, and

assigning the two-dimensional value [R1, R2] to the first class, if there exist a value [X1, Y1] that is equal to [R1, R2] and assign the two-dimensional value [R1, R2] to the second class, if there exist a value [X2, Y2] that is equal to [R1, R2].

18. The method according to claim 1 wherein the illumination of the region is with light containing the first narrow band of wavelengths and the second narrow band of wavelengths and additional light with wavelengths outside the first and the second narrow band, and wherein the measuring of the reflected light includes filtering of the light with a wavelength filter having a selection of wavelengths only in the first narrow band of wavelengths and the second narrow band of wavelengths.

19. The method of claim 18, wherein the illumination of the region is with broadband light.

20. The method of claim 18, wherein the illumination of the region is with light sources emitting light containing only narrow bands of wavelengths.

21. The method of claim 20, wherein the illumination of the region is with light sources emitting light containing only the first narrow band of wavelengths and the second narrow band of wavelengths.

22. The method of claim 1, further comprising image acquisition with an optoelectronic system of the surface that contains the region and subsequent image processing, where the image of the surface is acquired in sections, where the image section is divided into a multiplicity of pixels forming an image matrix and each pixel is assigned a signal value representative for the reflected light from the corresponding region.

23. The method of claim 1, wherein the selection of the two-dimensional values for the first and the second class involves determining a probability density X for the reflectance from the region at the first band and a probability density Y for the reflectance from the region at the second band, and in a two-dimensional representation with the reflectance values of X and Y as entrances, respectively, selecting a border between two groups of entrances, where one group is representative for a clean region and the other group is representative for a contaminated region.

24. The method of claim 1, wherein the selection of the first and the second band of wavelengths involves calculation of the Jeffreys-Matusita distance for reflectance probabilities for a range of first wavelength bands and a range of second wavelength bands and selecting a combination of the first and the second wavelength bands for which the Jeffreys-Matusita distance is above 0.8.

25. The method of claim 24, further comprising calculating a misclassification error bound for reflectance probabilities for a range of first wavelength bands and a range of second wavelength bands and selecting a combination of the first and the second wavelength bands for which the misclassification error bound is below a value of one minus half the Jeffreys-Matusita distance squared, 1½

·

JM².

26. The method of claim 1, further comprising:

selecting a third narrow wavelength band, selecting a first class with three-dimensional values [X1, Y1, Z1], which corresponds to a clean region and a second class with three-dimensional values [X2, Y2, Z2], which corresponds to a contaminated region, where Z1 and Z2 are values for the reflectance from the region at the third band,

illuminating the region in addition with light having the third band,

measuring in addition the reflected light from the region at the third band to determine the respective reflectance R3,

assign a three-dimensional value [R1, R2, R3] to the first class, if there exist a value [X1, Y1, Z1] that equals [R1, R2, R3], and assign the three dimensional value [R1, R2, R3] to the second class, if there exist a value [X2, Y2, Z2] that equals [R1, R2, R3].

27. The method of claim 1, wherein the first band is about 800 ran and the second band is about 650 nm when determining the cleanliness of concrete, or the first band is about 650 nm and the second band about 450 nm when determining the cleanliness of steel.

28. The method of claim 1, wherein the method further comprises inspecting a surface for the cleaning process and producing a cleanness map for the surfaces with data indicative of the degree of cleanness in dependence of the location.

29. The method of claim 28, wherein the method further comprises evaluating the degree of cleanness in relation to predetermined criteria and indicating on the cleanness map the location, where the found degree of cleanness does not correspond to the predetermined criteria.

30. The method of claim 1, wherein the method further comprises cleaning an animal houses.

31. An apparatus for performing the method of claim 1 comprising an illuminator for illumination with the first wavelength and the second wavelength, a digital video camera electronically coupled to a computer for measuring the reflected light with a spatial resolution, the camera being arranged to detect the reflected light under conditions minimising the direct reflection from the surface of the region.

32. A cleaning robot for performing the method of claim 1, wherein the cleaning robot comprises a vehicle onto which at least one robot arm is mounted, and wherein an illuminator for illuminating the region with light having the first narrow band of wavelengths and illuminating the region with light having the second narrow band of wavelengths is mounted on a robot arm and wherein a camera for measuring the reflected light from the region at the first and the second band is mounted on a robot arm.

33. A cleaning robot comprising an apparatus of claim 31, wherein the cleaning robot comprises a vehicle onto which at least one robot arm is mounted, and wherein the illuminator for illuminating the region with light having the first narrow band of wavelengths and illuminating the region with light having the second narrow band of wavelengths is mounted on a robot arm and wherein the camera for measuring the reflected light from the region at the first and the second band is mounted on a robot arm.

2-17. -17. (canceled)