HIGH FREQUENCY MEASUREMENT SYSTEM
First Claim
1. A high frequency non-linear measurement system including one or more multiplexer circuits, wherein each multiplexer circuit comprises a first signal-combining circuit and a second signal-combining circuit, each signal-combining circuit comprising a pair of directional couplers connected via a pair of signal filters arranged in parallel.
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Abstract
The invention concerns a high frequency non-linear measurement system for analysing the behaviour of a high frequency device, for example a device for use in a high power, high frequency amplifier, such as an amplifier for use in a mobile telephone network or other telecommunications-related base-station. An embodiment of the invention provides a high frequency non-linear measurement system including one or more multiplexer circuits. Each multiplexer circuit comprises a first signal-combining circuit and a second signal-combining circuit. Each signal-combining circuit comprises a pair of directional couplers connected via a pair of signal filters arranged in parallel.
48 Citations
27 Claims
- 1. A high frequency non-linear measurement system including one or more multiplexer circuits, wherein each multiplexer circuit comprises a first signal-combining circuit and a second signal-combining circuit, each signal-combining circuit comprising a pair of directional couplers connected via a pair of signal filters arranged in parallel.
- 2. A high frequency non-linear measurement system including one or more demultiplexer circuits, wherein each demultiplexer circuit comprises a first signal-splitting circuit and a second signal-splitting circuit, each signal-splitting circuit comprising a pair of directional couplers connected via a pair of signal filters arranged in parallel.
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12. A method of measuring the response of an electronic device to a high frequency input signal, the method including the steps of:
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providing an electronic device under test, the device having at least two ports, providing a plurality of high-frequency signals at different frequencies, modifying the plurality of high-frequency signals, multiplexing the modified plurality of high-frequency signals into a combined load-pull signal, applying a high-frequency test signal comprising the load-pull signal at a port of the device under test, and measuring the response of the device-under-test to the test signal applied to the device, wherein the multiplexing step is conducted by passing signals via a multiplexer circuit comprising a first signal-combining circuit and a second signal-combining circuit, each signal-combining circuit comprising a pair of directional couplers connected via a pair of signal filters arranged in parallel. - View Dependent Claims (15, 16)
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13. A method of measuring the response of an electronic device to a high frequency input signal, the method including the steps of:
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providing an electronic device under test, the device having at least two ports, applying a high-frequency test signal, comprising a plurality of different high-frequency load-pull components, at a port of the device under test, measuring the response of the device-under-test to the test signal applied to the device, and demultiplexing a high-frequency composite signal into a plurality of component parts, wherein the demultiplexing step is conducted by passing signals via a multiplexer circuit comprising a first signal-splitting circuit and a second signal-splitting circuit, each signal-splitting circuit comprising a pair of directional couplers connected via a pair of signal filters arranged in parallel.
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17. A high frequency non-linear measurement system including one or more multiplexer/demultiplexer circuits, wherein each multiplexer/demultiplexer circuit comprises a cascade of high frequency directional filters.
Specification