Testing Auxiliary Apparatus

• US 20120119773A1
• Filed: 12/08/2010
• Published: 05/17/2012
• Est. Priority Date: 11/15/2010
• Status: Abandoned Application

• Current Assignee: Askey Computer Corporation (ASUSTek Computer, Inc.)
• Original Assignee: Askey Computer Corporation (ASUSTek Computer, Inc.)
• Inventors: Yu, Zhong-Yuan, Hsieh, Ching-Feng
• Application Number:
  US12/963,151
• Publication Number:
  US 20120119773A1
• Time in Patent Office: Days
• US Class Current: 324/756.03
• CPC Class Codes: G01R 31/2808 Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards probe, multiprobe, probe manipulator or probe fixture G01R1/067

Abstract

A testing auxiliary apparatus for assisting a testing apparatus to test signals of testing points of a circuit board, includes: a testing base having a testing platform with probes vertically disposed thereon and corresponding to the testing points, and extension testing points exposed from the testing platform and electrically connected to the probes so as for the testing apparatus to test signals; a carrier board disposed on the testing base and capable of ascending and descending relative to the testing platform and including a positioning portion for positioning the circuit board and through holes corresponding to the probes; and a pressing member disposed on the testing base for pressing the circuit board and driving the carrier board to descend such that the probes come into contact with the testing points through the through holes, thereby avoiding the inconvenience of searching for testing points on the circuit board with high-density pins.

Claims

1. A testing auxiliary apparatus for assisting a testing apparatus to test signals of a plurality of testing points of a circuit board under test, comprising:

a testing base comprising a testing platform, a plurality of probes vertically disposed on the testing platform and corresponding to the testing points of the circuit board under test, respectively, and a plurality of extension testing points exposed from the testing platform and electrically connected to the probes, respectively, so as for the testing apparatus to perform the signal testing process;

a carrier board disposed on the testing base and capable of ascending and descending relative to the testing platform, wherein the carrier board comprises a positioning portion for positioning the circuit board under test and a plurality of through holes corresponding in position to the probes, respectively; and

a pressing member disposed on the testing base for pressing the circuit board under test and driving the carrier board to descend so as to cause the probes to pass through the corresponding through holes of the carrier board and come into contact with the testing points of the circuit board under test, respectively.

2. The apparatus of claim 1, further comprising a plurality of sliding members vertically disposed on the testing platform and penetrating through the carrier board for allowing the carrier board to ascend and descend relative to the testing platform.

3. The apparatus of claim 1, wherein the carrier board further has a plurality of return springs connected to the testing base for supporting the carrier board over the testing platform and providing return forces to the carrier board.

4. The apparatus of claim 1, wherein the pressing member has a plurality of pins disposed on a surface facing the carrier board such that when the pressing member is pressed down towards the circuit board under test on the carrier board, the pins secure the circuit board under test on the carrier board.

5. The apparatus of claim 1, wherein the testing base has a standing frame disposed at one end thereof, and the standing frame has a driving unit disposed thereon for controlling movement of the pressing member, wherein the driving unit comprises:

a fastening member fastened to the standing frame and having a first coupling end and a first fastening end opposite to the first coupling end and having a tubular portion;

a handle having a bending portion, a pivot end, and a holding portion extending from two ends of the bending portion, respectively, wherein the pivot end is pivotally connected to the first coupling end of the fastening member;

an operating rod having a second coupling end penetrating through the tubular portion and a second fastening end opposite to the second coupling end and fastened to an end surface of the pressing member; and

a link member having one end pivotally connected to the bending portion of the handle and the other end pivotally connected to the second coupling end of the operating rod penetrating through the tubular portion.

6. The apparatus of claim 1, wherein the pressing member has a plurality of pressing probes disposed on a surface facing the carrier board, the pressing probes being adapted to electrically contact the circuit board under test when the circuit board under test is pressed by the pressing member.

7. The apparatus of claim 6, wherein the pressing probes function as power terminals or ground terminals of the circuit board under test for a power supply circuit.

8. The apparatus of claim 1, wherein the plurality of probes function as power terminals or ground terminals of the circuit board under test for a power supply circuit.

9. The apparatus of claim 8, wherein the testing base further has a control switch for switching on or switching off the power supply circuit.

10. The apparatus of claim 1, wherein the positioning portion of the carrier board is a recess and the through holes of the carrier board are disposed in the recess.