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METHODS AND APPARATUS FOR MEASURING ANALYTES USING LARGE SCALE FET ARRAYS

  • US 20160178570A1
  • Filed: 12/16/2015
  • Published: 06/23/2016
  • Est. Priority Date: 12/18/2014
  • Status: Active Grant
First Claim
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1. A semiconductor device, comprising:

  • a first field effect transistor (FET) connected in series to a second FET;

    a third FET connected in series to the first FET and the second FET;

    bias circuitry coupled to the first FET and the second FET; and

    an output conductor coupled to a terminal of the second FET, wherein the output conductor obtains an output signal from the second FET that is independent of the first FET.

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