WEAR-OUT MONITOR DEVICE
First Claim
Patent Images
1. An integrated circuit device with wear out monitoring, the integrated circuit device comprising:
- a core circuit;
a wear-out monitor device configured to adjust an indication of wear out of the core circuit regardless of whether the core circuit is activated; and
a sensing circuit configured to detect an electrical property associated with the wear-out monitor device, wherein the electrical property is indicative of the wear out of the core circuit.
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Abstract
The disclosed technology generally relates to integrated circuit devices with wear out monitoring. An integrated circuit device includes a core circuit and a wear-out monitor device. The wear-out monitor device configured to adjust an indication of wear out of the core circuit regardless of whether the core circuit is activated The integrated circuit further includes a sensing circuit coupled to the wear-out monitor device and configured to detect an electrical property of the wear-out monitor device that is indicative of a wear-out level of the core-circuit.
10 Citations
25 Claims
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1. An integrated circuit device with wear out monitoring, the integrated circuit device comprising:
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a core circuit; a wear-out monitor device configured to adjust an indication of wear out of the core circuit regardless of whether the core circuit is activated; and a sensing circuit configured to detect an electrical property associated with the wear-out monitor device, wherein the electrical property is indicative of the wear out of the core circuit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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19. A method of monitoring a wear-out of an integrated circuit device comprising a core circuit and a wear-out monitor device, the method comprising:
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detecting an electrical property of a wear-out monitor device, wherein the wear-out monitor device comprises a semiconductor material and monitor atoms configured to diffuse into the semiconductor material, and wherein the electrical property corresponds to a concentration profile of the monitor atoms in the semiconductor material that is indicative of wear-out of the core circuit; and reporting the electrical property of the wear-out monitor device. - View Dependent Claims (20, 21, 22, 23)
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24. An integrated circuit device with wear-out monitoring, the integrated circuit device comprising:
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a core circuit; means for recording wear-out of the core circuit as a doping profile of a diffusing material in a substrate; and means for detecting an indication of wear-out of the core circuit, the means for recording wear-out being in communication with the means for recording the indication of wear-out. - View Dependent Claims (25)
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Specification