Components and configurations for test and valuation of integrated optical busses
First Claim
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1. A system for the testing of optical buses, the system comprising:
- a plurality of optical registers disposed on a ASIC;
an optical bus to be tested linking and providing addressed data to optical registers in said plurality of optical registers; and
an electrical bus for readout of data contained in said optical registers, connecting said optical registers in said plurality of optical registers;
wherein said optical registers are optical latches.
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Abstract
An apparatus and method is provided for the testing of an optical bus, that method having: loading transmission test data and address information for at least one receiving cell via an electronic bus in a first register; setting a clock rate for the optical bus; employing the optical bus to transmit the test data from the first register to the at least one receiving cell; reading out received test data from the receiving cell via the electronic bus; correlating the received test data from the first register with the transmission test data; analyzing errors in the received data and handling of the received data by the bus.
74 Citations
7 Claims
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1. A system for the testing of optical buses, the system comprising:
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a plurality of optical registers disposed on a ASIC; an optical bus to be tested linking and providing addressed data to optical registers in said plurality of optical registers; and an electrical bus for readout of data contained in said optical registers, connecting said optical registers in said plurality of optical registers; wherein said optical registers are optical latches. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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Specification
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Current AssigneeBAE Systems Information and Electronic Systems Integration Incorporated (BAE Systems Plc)
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Original AssigneeBAE Systems Information and Electronic Systems Integration Incorporated (BAE Systems Plc)
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InventorsCarothers, Daniel N., Berger, Richard W.
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Primary Examiner(s)KHUU, HIEN DIEU THI
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Application NumberUS12/201,823Publication NumberTime in Patent Office1,061 DaysField of Search702/117, 702/120US Class Current702/120CPC Class CodesG06F 11/221 to test buses, lines or int...
