Current measurement method, inspection method of semiconductor device, semiconductor device, and test element group
First Claim
1. A method for measuring current, comprising the steps of:
- applying a first potential to a first terminal of a transistor for evaluation;
applying a second potential to a first terminal of a transistor for injection of charge;
accumulating predetermined charge in a node where a second terminal of the transistor for evaluation and a second terminal of the transistor for injection of charge are connected to each other while the transistor for injection of charge is in an on state;
turning off the transistor for injection of charge;
measuring an amount of change in a potential of the node, due to change in an amount of the charge held in the node; and
calculating a value of current flowing between the first terminal and the second terminal of the transistor for evaluation, from the amount of change in the potential.
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Accused Products
Abstract
One object is to provide a method for measuring current by which minute current can be measured. A value of current flowing through an electrical element is not directly measured but is calculated from change in a potential observed in a predetermined period. The method for measuring current includes the steps of: applying a predetermined potential to a first terminal of an electrical element having the first terminal and a second terminal; measuring an amount of change in a potential of a node connected to the second terminal; and calculating, from the amount of change in the potential, a value of current flowing between the first terminal and the second terminal of the electrical element. Thus, the value of minute current can be measured.
108 Citations
9 Claims
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1. A method for measuring current, comprising the steps of:
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applying a first potential to a first terminal of a transistor for evaluation; applying a second potential to a first terminal of a transistor for injection of charge; accumulating predetermined charge in a node where a second terminal of the transistor for evaluation and a second terminal of the transistor for injection of charge are connected to each other while the transistor for injection of charge is in an on state; turning off the transistor for injection of charge; measuring an amount of change in a potential of the node, due to change in an amount of the charge held in the node; and calculating a value of current flowing between the first terminal and the second terminal of the transistor for evaluation, from the amount of change in the potential. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A test element group comprising:
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a transistor for evaluation; a transistor for injection of charge; a capacitor; and an output circuit, wherein a first terminal of the transistor for evaluation is a terminal to which a first potential is applied, wherein a first terminal of the transistor for injection of charge is a terminal to which a second potential is applied, and wherein a second terminal of the transistor for evaluation, a second terminal of the transistor for injection of charge, a first terminal of the capacitor, and an input terminal of the output circuit are connected to one another. - View Dependent Claims (9)
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Specification